S2 E5: Dilip Shah

Link Discussed in Episode: https://www.youtube.com/watch?v=8xu31rwbWu4

 

Dilip A. Shah has over 45 years of industry experience in metrology, electronics, instrumentation, measurement and computer applications of statistics in the Quality Assurance areas. He has been employed in various positions with Philips Electronics (UK), Kodak Ltd. (UK), Instruments Division of Monsanto Corporation, Flexsys America and Alpha Technologies. He is currently a Principal of E = mc3 Solutions, a consulting practice that provides training and consulting and auditing solutions in ISO/IEC 17025, ISO 9001, Measurement Uncertainty and computer applications.

Dilip is an ASQ Fellow and certified by American Society for Quality (ASQ) as a Certified Quality Auditor, Certified Quality Engineer and Certified Calibration Technician. Dilip has served on the advisory board of the University of Akron Engineering and Science Technology Division

Dilip is the co-author of The Metrology Handbook (1st and 2nd editions) published by the ASQ Quality Press and has contributed to the 2010 re-write of the CCT Primer by the Quality Council of Indiana. Dilip participated in the initial development of ASQ’s Certified Calibration Technician (CCT) exam. Dilip participates actively in the measurement related issues through National Conference of Standards Laboratories International (NCSLI) and the west coast-based Measurement Science Conference (MSC) where he presents sessions, papers and workshops. Dilip is a member of American Society for Quality (ASQ) and Institute of Electrical and Electronic Engineers (IEEE).

Dilip is the recipient of NCSLI’s 2011 Education & Training Award, MSC's 2010 Andrew J. Woodington Award, ASQ-MQD’s 2005 Max J. Unis Award and co-recipient of MSC’s 2003 Algie Lance Award for the Best Paper.

Dilip has served as a Member of the A2LA Board of Directors (2006-2014). Dilip served as the NCSLI Conference Tutorial Program Chair (2012 - 2017) and is a frequent contributor to the ASQ Quality Progress Magazine’s Measure for Measure column and ASQ Expert Answers Blog Contributor.

Ryan Egbert