Jeff Gust - Fluke Chief Corporate Metrologist

Jeff Gust is the Chief Corporate Metrologist for Fluke.

He has been an active member of the metrology community, writing and presenting numerous technical papers.  He has developed quality and training documents for NIST and for the United Nations Industrial Development Organization (UNIDO).  He has served as a consultant to several accreditation bodies and was an ISO/IEC 17025 assessor for 9 years.  Jeff was President of NCSL International and has served for many years on its Board of Directors.  Jeff represents NCSLI at the International Laboratory Accreditation Cooperation (ILAC) and is currently the Chair of the Laboratory Committee and member of the ILAC Executive.

Jeff has served on writing committees to revise or develop:

NIST RP 960-12 Stopwatch and Timer Calibrations

ISO/IEC 17025:2017 General requirements for the competence of testing and calibration laboratories

ISO 17043 General Requirements for Proficiency Testing

ILAC G8 Guidelines on Decision Rules and Statements of Conformity

ILAC P10 Policy on Metrological Traceability of Measurement Results

ILAC P14 Policy for Measurement Uncertainty in Calibration

Ryan Egbert